Total Dose and Single Event Testing of the Intersil ISL75051SRH Low Dropout Regulator.
| Autor: | van Vonno, N. W., Pearce, L. W., Knudsen, K. C., Thomson, E. J., Bernard, T. M., Chesley, P. J. |
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| Zdroj: | 2012 IEEE Radiation Effects Data Workshop; 1/ 1/2012, p1-6, 6p |
| Abstrakt: | We report the results of low and high dose rate total dose and SEE testing of the Intersil ISL75051SRH low dropout regulator together with a discussion of the part's electrical specifications and wafer fabrication process. [ABSTRACT FROM PUBLISHER] |
| Databáze: | Complementary Index |
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