| Autor: |
Kuehn, Sven, Wild, Martin, Sepan, Peter, Grobelaar, Eugene, Kuster, Niels |
| Zdroj: |
2012 IEEE Electrical Design of Advanced Packaging & Systems Symposium (EDAPS); 1/ 1/2012, p109-112, 4p |
| Abstrakt: |
We present an automated near-field scanner for system- to chip-level EMC/EMI evaluations in the RF domain. The scanning system combines a large scanning volume of 500×500×100mm3 with micrometre resolution. A novel optical surface reconstruction system allows measurement of the height map of the device under (DUT) test with better than 20µm uncertainty. This allows scanning at a precise distance above arbitrary electronic components. Key components of the scanning system are novel active miniaturized electro-optical time-domain E- and H-field sensors in the frequency range from 0.01 to >6GHz measuring the complex amplitude with a dynamic range of >120dB. The full optical isolation of the probes eliminates disturbance of the field of the DUT compared to electrically connected probes and offers up to 60dB better sensitivity than passive electro-optical probes. [ABSTRACT FROM PUBLISHER] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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