Maintenance of serviceability of integrated circuits at radiation influence.
| Autor: | Bogatyrev, Yu. V., Korshunov, F. P., Lastovski, S. B., Turtsevich, A. S., Shwedov, S. V., Belous, A. I. |
|---|---|
| Zdroj: | 2012 22nd International Crimean Conference 'Microwave & Telecommunication Technology'; 1/ 1/2012, p798-800, 3p |
| Abstrakt: | A number of the developed methods of maintenance of radiation resistance of integrated circuits (BiCMOS and CMOS) is submitted. [ABSTRACT FROM PUBLISHER] |
| Databáze: | Complementary Index |
| Externí odkaz: |
|