| Autor: |
Farley, D.M., Boschman, F., Bullema, J.E., Gielen, A.W.J., Hesen, P., Krugers, J.P.H.M., Swartjes, F., van Zeijl, H., Zhang, G.Q. |
| Zdroj: |
2012 13th International Thermal, Mechanical & Multi-Physics Simulation & Experiments in Microelectronics & Microsystems; 1/ 1/2012, p1/3-3/3-3/3, 0p |
| Abstrakt: |
The reliability assessment aspect of the LED field is not fully developed. The lack of complete understanding is due, in part, to the newness of the field. SSL has not existed long enough to directly gauge the accuracy of the Lifetime Assessments being made. The approach of using simulation in qualification to Lifetime Assessment is one of the major techniques used in the electronics field, in general. This methodology uses a complex approach of characterization, testing, and mathematical simulation to produce what some say is the best route for electronics reliability assessment. At present, literature surveys produce only a few papers implementing any simulation approach to SSL technology reliability assessment. [ABSTRACT FROM PUBLISHER] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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