| Autor: |
Kaplar, Robert, Brock, Reinhard, DasGupta, Sandeepan, Marinella, Matthew, Starbuck, Andrew, Fresquez, Armando, Gonzalez, Sigifredo, Granata, Jennifer, Quintana, Michael, Smith, Mark, Atcitty, Stanley |
| Zdroj: |
2011 37th IEEE Photovoltaic Specialists Conference; 1/ 1/2011, p001842-001847, 6p |
| Abstrakt: |
The inverter is still considered the weakest link in modern photovoltaic systems. Inverter failure can be classified into three major categories: manufacturing and quality control problems, inadequate design, and electrical component failure. It is often difficult to deconvolve the latter two of these, as electrical components can fail due to inadequate design or as a result of intrinsic defects. The aim of the current work is to utilize the extensive background in both inverter performance testing and component reliability found at Sandia National Laboratories to assess the role of component failures in PV performance and reliability. Although there is no consensus on the least reliable component in a modern inverter system, the IGBT is often blamed for failures and hence this was the first component we studied. A commercially available 600V, 60A, silicon IGBT found in common residential inverters was evaluated under normal and extreme operating conditions with DC and pulsed biasing schemes. Although most of the sample devices were robust even under extreme conditions, a few of the samples failed during operation well within the manufacturer-specified limits. Additionally, we have begun in situ monitoring of IGBTs as well as other components within an operating 700 W, single-phase inverter. The in situ testing will guide future device-level work since it allows us to understand the conditions that are experienced by inverter components in a realistic operating environment. [ABSTRACT FROM PUBLISHER] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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