The use of high-energy ion synchrotron at the ITEP for SEE testing of modern electronic components.

Autor: Zinchenko, V. F., Lavrentjev, K. V., Lipsky, A. K., Ulimov, V. N., Alexejev, N. N.
Zdroj: 2011 12th European Conference on Radiation & Its Effects on Components & Systems; 1/ 1/2011, p734-738, 5p
Abstrakt: The possibilities of using of high-energy heavy ion synchrotron at the Institute of Theoretical and Experimental Physics, Moscow, for single event effects testing of modern electronic components are investigated. The basic problems and offered approaches to their solution are considered. The obtained experimental data are discussed. [ABSTRACT FROM PUBLISHER]
Databáze: Complementary Index