| Autor: |
Chatterjee, I., Bhuva, B. L., Wen, S.-J., Wong, R. |
| Zdroj: |
2011 12th European Conference on Radiation & Its Effects on Components & Systems; 1/ 1/2011, p232-237, 6p |
| Abstrakt: |
Alpha particles are a critical reliability problem facing advanced technologies. This paper reports extensive tests over a wide range of technology nodes on CMOS SRAMs to study operating voltage, data pattern, operating frequency and operational-mode dependency of alpha particle induced single-event upsets rates. [ABSTRACT FROM PUBLISHER] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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