Bipolar resistive switching of zinc-tin-oxide resistive random access memory.

Autor: Murali, Santosh, Rajachidambaram, Jaana Saranya, Han, Seung-Yeol, Chang, Chih-Hung, Herman, Gregory S., Conley, John F.
Zdroj: 2011 11th IEEE International Conference on Nanotechnology; 1/ 1/2011, p740-743, 4p
Abstrakt: Bipolar switching is reported for the first time using solution deposited amorphous zinc-tin-oxide (ZTO). The impact of compliance current (CC) on the SET voltage, the magnitude of the low and high resistance states, and the switching ratio is investigated for Al/ZTO/Ir resistive random access memory (RRAM) devices. [ABSTRACT FROM PUBLISHER]
Databáze: Complementary Index