Moderate-dose proton implantation through double-barrier structures.

Autor: Billen, K., Kelly, M.J., Gwilliam, R.M., Wilson, R.J., Henini, M.
Zdroj: Electronics Letters (Institution of Engineering & Technology); 01/18/1996, Vol. 32 Issue 2, p140-141, 2p
Databáze: Complementary Index