Generation-recombination noise in the channel of GaAs Schottky-gate field-effect transistors.

Autor: Sodini, D., Touboul, A., Lecoy, G., Savelli, M.
Zdroj: Electronics Letters (Institution of Engineering & Technology); 01/22/1976, Vol. 12 Issue 2, p42-43, 2p
Databáze: Complementary Index