The effect of dislocations on the capacitance vs. bias voltage characteristic of mos capppacitors.
| Autor: | Goklaney, S.M., Porter, W.A. |
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| Zdroj: | IEE-IERE Proceedings - India; Sep/Oct1974, Vol. 12 Issue 5, p184-187, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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