Incorporating high reliability into the design of microprocessor-based instrumentation.

Autor: Henderson, I.A., McGhee, J., Szaniawski, W., Domaradzki, P.
Zdroj: IEE Proceedings: Part A: Science, Measurement & Technology; Mar1991, Vol. 138 Issue 2, p105-112, 8p
Databáze: Complementary Index