An x-ray photoemission electron microscope using an electron mirror aberration corrector for the study of complex materials.
| Autor: | Feng, J, Forest, E, MacDowell, A A, Marcus, M, Padmore, H, Raoux, S, Robin, D, Scholl, A, Schlueter, R, Schmid, P, Stöhr, J, Wan, W, Wei, D H, Wu, Y |
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| Zdroj: | Journal of Physics: Condensed Matter; 4/27/2005, Vol. 17 Issue 16, pS1339-S1350, 12p |
| Databáze: | Complementary Index |
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