| Autor: |
Guerain, M., Goudeau, P., Panicaud, B., Grosseau-Poussard, J. L. |
| Předmět: |
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| Zdroj: |
Journal of Applied Physics; Feb2013, Vol. 113 Issue 6, p063502, 7p |
| Abstrakt: |
Spontaneous delamination process for α-Cr2O3 thermal oxide films growing on NiCr-30 alloys is studied thanks to micro Raman spectroscopy. In particular, stress maps are performed through and around buckles developed on chromia films. Depending on the cooling rate at the end of the oxidation process, different buckle types appear which are investigated. Associated residual stress distribution clearly evidences the stress release field. In addition, geometrical features are determined for the different buckle types, and from comparison with modelling describing buckle formation and propagation, it is possible to get the interface toughness distribution. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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