A dynamic test compaction procedure for high-quality path delay testing.
| Autor: | Fukunaga, Masayasu, Kajihara, Seiji, Wen, Xiaoqing, Maeda, Toshiyuki, Hamada, Shuji, Sato, Yasuo |
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| Zdroj: | Asia & South Pacific Conference on Design Automation, 2006; 1/24/2006, p348-353, 6p |
| Databáze: | Complementary Index |
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