Enhanced Fröhlich interaction of semiconductor cuprous oxide films determined by temperature-dependent Raman scattering and spectral transmittance.

Autor: Yu, Wenlei, Han, Meijie, Jiang, Kai, Duan, Zhihua, Li, Yawei, Hu, Zhigao, Chu, Junhao
Zdroj: Journal of Raman Spectroscopy; Jan2013, Vol. 44 Issue 1, p142-146, 5p
Abstrakt: Anomalous low temperature behaviors in cuprous oxide (Cu2O) film grown on quartz substrate have been investigated by temperature-dependent Raman and transmittance spectra. The longitudinal optical components of two Γ15- phonon modes become sharper and more intense at a low temperature. It can be found that the highest-order electronic transition located at 6.4 eV exhibits a minimum transmittance near 200 K. Correspondingly, the variations from phonon intensity ratios reveal obvious anomalies with the decreasing temperature, indicating the existence of strong electron-phonon coupling mediated by Fröhlich interaction in the Cu2O films below the temperature of 200 K. Copyright © 2012 John Wiley & Sons, Ltd. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index