Impact of interconnect length changes on effective materials properties (dielectric constant).
| Autor: | Lanzerotti, Mary Y., Fiorenza, Giovanni, Rand, Rick A. |
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| Zdroj: | Proceedings of the 2007 International Workshop: System Level Interconnect Prediction; 3/17/2007, p73-80, 8p |
| Databáze: | Complementary Index |
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