Path delay test compaction with process variation tolerance.

Autor: Kajihara, Seiji, Fukunaga, Masayasu, Wen, Xiaoqing, Maeda, Toshiyuki, Hamada, Shuji, Sato, Yasuo
Zdroj: Proceedings 42nd Design Automation Conference, 2005; Jun2005, p845-850, 6p
Databáze: Complementary Index