Design optimization for single-event upset robustness using simultaneous dual-VDD and sizing techniques.
| Autor: | Choudhury, Mihir R., Zhou, Quming, Mohanram, Kartik |
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| Zdroj: | 2006 IEEE/ACM International Conference on Computer Aided Design; Nov2006, p204-209, 6p |
| Databáze: | Complementary Index |
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