Depth first generation of long patterns.
Autor: | Agarwal, Ramesh C., Aggarwal, Charu C., Prasad, V. V. V. |
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Zdroj: | Proceedings of the Sixth ACM SIGKDD International Conference: Knowledge Discovery & Data Mining; Aug2000, p108-118, 11p |
Databáze: | Complementary Index |
Externí odkaz: |