Nyquist data converter testing and yield analysis using behavioral simulation.
| Autor: | Liu, Edward W. Y., Sangiovanni-Vincentelli, Alberto L. |
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| Zdroj: | Proceedings of the 1993 IEEE/ACM International Conference: Computer-aided Design; 11/ 7/1993, p341-348, 8p |
| Databáze: | Complementary Index |
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