A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment.

Autor: Miyase, Kohei, Yamato, Yuta, Noda, Kenji, Ito, Hideaki, Hatayama, Kazumi, Aikyo, Takashi, Wen, Xiaoqing, Kajihara, Seiji
Zdroj: 2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers; Nov2009, p97-104, 8p
Databáze: Complementary Index