Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification.
| Autor: | Miyase, Kohei, Noda, Kenji, Ito, Hideaki, Hatayama, Kazumi, Aikyo, Takashi, Yamato, Yuta, Furukawa, Hiroshi, Wen, Xiaoqing, Kajihara, Seiji |
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| Zdroj: | Proceedings of the 2008 IEEE/ACM International Conference: Computer-aided Design; 11/10/2008, p52-58, 7p |
| Databáze: | Complementary Index |
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