A novel active harmonic load-pull setup for on-wafer device linearity characterization.
| Autor: | Spirito, M., de Vreede, L.C.N., de Kok, M., Pelk, M., Hartskeerl, D., Jos, H.F.F., Mueller, J.E., Burghartz, J. |
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| Zdroj: | 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535); 2004, p1217-1217, 1p |
| Databáze: | Complementary Index |
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