On-wafer microwave characterization of ferroelectric thin film phase shifters.
| Autor: | Suhermann, P.H., Jackson, T.J., Koutsonas, Y., Chakalov, R.A., Lancaster, M.J. |
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| Zdroj: | 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535); 2004, p265-265, 1p |
| Databáze: | Complementary Index |
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