Trapping effects in wide-bandgap microwave FETs.

Autor: Binari, S.C., Klein, P.B., Kazior, T.E.
Zdroj: 2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278); 2002, p1823-1826, 4p
Databáze: Complementary Index