Trapping effects in wide-bandgap microwave FETs.
Autor: | Binari, S.C., Klein, P.B., Kazior, T.E. |
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Zdroj: | 2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278); 2002, p1823-1826, 4p |
Databáze: | Complementary Index |
Externí odkaz: |