Hot spots induced by reverse leakage current flow through the semiconductor-dielectric interface from device PN junction periphery.
| Autor: | Obreja, V.V.N., Obreja, A.C., Nuttall, K.I. |
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| Zdroj: | 2010 International Semiconductor Conference (CAS); 2010, p439-442, 4p |
| Databáze: | Complementary Index |
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