Test compression and hardware decompression for scan-based SoCs.
Autor: | Wolff, F.G., Papachristou, C., McIntyre, D.R. |
---|---|
Zdroj: | Proceedings Design, Automation & Test in Europe Conference & Exhibition; 2004, p716-716, 1p |
Databáze: | Complementary Index |
Externí odkaz: |