Lifetime characterization of capacitive RF MEMS switches.
| Autor: | Goldsmith, C., Ehmke, J., Malczewski, A., Pillans, B., Eshelman, S., Yao, Z., Brank, J., Eberly, M. |
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| Zdroj: | 2001 IEEE MTT-S International Microwave Symposium Digest (Cat. No.01CH37157); 2001, p227-227, 1p |
| Databáze: | Complementary Index |
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