SEM investigation on IGBT latch-up failure.
| Autor: | Wuchen Wu, Changyong Fan, Yajie Wang, Yangang Wang, Xueqing Cui, Jacob, P., Held, M. |
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| Zdroj: | 2001 6th International Conference on Solid-State & Integrated Circuit Technology. Proceedings (Cat. No.01EX443); 2001, p1040-1040, 1p |
| Databáze: | Complementary Index |
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