A new linearity measurement algorithm for sub-micron microwave cmos.
| Autor: | Woo Young Choi, Byung Yong Choi, Dong-Soo Woo, Jong Duk Lee, Byung-Gook Park |
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| Zdroj: | Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412); 2003, p374-376, 3p |
| Databáze: | Complementary Index |
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