Influence of wiring parasitics on CMOS logic gates.

Autor: Rodoni, L.C., Ellinger, F., von Buren, G., Jackel, H.
Zdroj: Proceedings of the 2003 SBMO/IEEE MTT-S International Microwave & Optoelectronics Conference - IMOC 2003 (Cat. No.03TH8678); 2003, pPD67-PD67, 1p
Databáze: Complementary Index