Influence of wiring parasitics on CMOS logic gates.
Autor: | Rodoni, L.C., Ellinger, F., von Buren, G., Jackel, H. |
---|---|
Zdroj: | Proceedings of the 2003 SBMO/IEEE MTT-S International Microwave & Optoelectronics Conference - IMOC 2003 (Cat. No.03TH8678); 2003, pPD67-PD67, 1p |
Databáze: | Complementary Index |
Externí odkaz: |