Shallow junction technology for advanced CMOS devices - transitioning to plasma doping from beamline implantation.

Autor: Walther, S.R., Variam, N., Norasethekul, S., Weeman, J., Mehta, S.
Zdroj: Proceedings of the 14th International Conference on Ion Implantation Technology, 2002; 2002, p103-106, 4p
Databáze: Complementary Index