Atpg padding and ate vector repeat per port for reducing test data volume.
| Autor: | Vranken, H., Hapke, F., Rogge, S., Chindamo, D., Volkerink, E. |
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| Zdroj: | International Test Conference, 2003. Proceedings ITC 2003; 2003, p1069-1078, 10p |
| Databáze: | Complementary Index |
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