Registration of Tapping and Contact Mode Atomic Force Microscopy Images.
| Autor: | Fan, Y., Chen, Q., Kumar, S.A., Baczewski, A.D., Tram, N.V., Ayres, V.M., Udpa, L., Rice, A.F. |
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| Zdroj: | 2006 Sixth IEEE Conference on Nanotechnology; 2006, p193-196, 4p |
| Databáze: | Complementary Index |
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