Evaluation of Stress-Induced Effects in Electronic Characteristics of nMOSFETs.
| Autor: | Koganemaru, M., Ikeda, T., Miyazaki, N., Tomokage, H. |
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| Zdroj: | 2006 1st Electronic Systemintegration Technology Conference; 2006, p1174-1181, 8p |
| Databáze: | Complementary Index |
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