Determination of Device Lifetime Under Pulsed Operating Conditions.
Autor: | Billups, A.J., O'Haver, K.W., Kopp, B.A. |
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Zdroj: | Thermal & Thermomechanical Proceedings 10th Intersociety Conference on Phenomena in Electronics Systems, 2006 (ITHERM 2006); 2006, p1097-1101, 5p |
Databáze: | Complementary Index |
Externí odkaz: |