Determination of Device Lifetime Under Pulsed Operating Conditions.

Autor: Billups, A.J., O'Haver, K.W., Kopp, B.A.
Zdroj: Thermal & Thermomechanical Proceedings 10th Intersociety Conference on Phenomena in Electronics Systems, 2006 (ITHERM 2006); 2006, p1097-1101, 5p
Databáze: Complementary Index