Diagnosis of full open defects in interconnect lines with fan-out.
| Autor: | Rodri?guez-Monta?e?s, R., Arumi?, D., Figueras, J., Einchenberger, S., Hora, C., Kruseman, B. |
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| Zdroj: | 2010 15th IEEE European Test Symposium (ETS); 2010, p233-238, 6p |
| Databáze: | Complementary Index |
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