Impact of self-heating on digital SOI and strained-silicon CMOS circuits.
| Autor: | Jenkins, K.A., Franch, R.L. |
|---|---|
| Zdroj: | IEEE International SOI Conference, 2003; 2003, p161-163, 3p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Jenkins, K.A., Franch, R.L. |
|---|---|
| Zdroj: | IEEE International SOI Conference, 2003; 2003, p161-163, 3p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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