Reliability assessment in different HTO test conditions of AlGaN/GaN HEMTs.
| Autor: | Malbert, N., Labat, N., Curutchet, A., Sury, C., Hoel, V., de Jaeger, J.-C., Defrance, N., Douvry, Y., Dua, C., Oualli, M., Piazza, M., Bru-Chevallier, C., Bluet, J.-M., Chikhaoui, W. |
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| Zdroj: | 2010 IEEE International Reliability Physics Symposium (IRPS); 2010, p139-145, 7p |
| Databáze: | Complementary Index |
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