Robust high current ESD performance of nano-meter scale DeNMOS by source ballasting.
| Autor: | Chatterjee, A., Brewer, F., Gossner, H., Pendharkar, S., Duvvury, C. |
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| Zdroj: | 2010 IEEE International Reliability Physics Symposium (IRPS); 2010, p853-856, 4p |
| Databáze: | Complementary Index |
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