Sensitive measurement method for evaluation of high thermal resistance in bipolar transistors.
| Autor: | Nenadovic, N., Nanver, L.K., Schellevis, H., de Mooij, D., Zieren, V., Slotboom, J.W. |
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| Zdroj: | Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002 (ICMTS 2002); 2002, p77-82, 6p |
| Databáze: | Complementary Index |
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