Low current application dedicated process characterization method.
| Autor: | Rahajandraibe, W., Dufaza, C., Auvergne, D., Cialdella, B., Majoux, B., Chowdhury, V. |
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| Zdroj: | Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002 (ICMTS 2002); 2002, p41-44, 4p |
| Databáze: | Complementary Index |
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