Can nanoindentation help to determine the local mechanical properties of microelectronic materials? a state-of-the-art review.

Autor: Albrecht, H.-J., Hannach, T., Hase, A., Juritza, A., Muller, K., Muller, W.H.
Zdroj: Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971); 2004, p462-467, 6p
Databáze: Complementary Index