Characterizing antireflection coatings on textured monocrystalline silicon with Spectroscopic Ellipsometry.
| Autor: | Jianing Sun, Saenger, M.F., Schubert, M., Hilfiker, J.N., Synowicki, R., Herzinger, C.M., Woollam, J.A. |
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| Zdroj: | 2009 34th IEEE Photovoltaic Specialists Conference (PVSC); 2009, p001407-001411, 5p |
| Databáze: | Complementary Index |
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