Small embedded sensors for accurate temperature measurements in DMOS power transistors.
Autor: | Pfost, M., Costachescu, D., Podgaynaya, A., Stecher, M., Bychikhin, S., Pogany, D., Gornik, E. |
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Zdroj: | 2010 IEEE International Conference on Microelectronic Test Structures (ICMTS); 2010, p3-7, 5p |
Databáze: | Complementary Index |
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