Seeing inside chips and cells: high-resolution subsurface imaging of integrated circuits, quantum dots and subcellular structures.
| Autor: | Goldberg, B.B., Swan, A.K., Moiseev, L., Dogan, M., Karl, W.C., Davis, B., Cantor, C.R., Ippolito, S.B., Thorne, S.A., Eraslan, M.G., Liu, Z., Goldberg, M.B., Unlu, M.S., Leblebici, Y. |
|---|---|
| Zdroj: | International Quantum Electronics Conference, 2004. (IQEC); 2004, p580-581, 2p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|