A novel lateral overflow drain technology for high quantum efficiency CCD imagers.

Autor: Adachi, S., Simada, H., Gotoh, H., Mizobuchi, K.
Zdroj: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138); 2000, p693-696, 4p
Databáze: Complementary Index