Laser thermal annealed SSR well prior to epi-channel growth (LASPE) for 70 nm nFETS.

Autor: Jung-Ho Lee, Jeongyoub Lee, Somit Talwar, Yun Wang, Daehee Weon, Seungho Hahn, Changyong Kang, Taeeun Hong, Younggwan Kim, Haewang Lee, Seokkiu Lee, Jaesung Roh, Daegwan Kang, Jinwon Park
Zdroj: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138); 2000, p441-444, 4p
Databáze: Complementary Index