Testing of pixellated CZT and CdTe detectors at the 200µm level.
| Autor: | Jung, G., Berry, A., Midgley, S., Panjkovic, G. |
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| Zdroj: | Proceedings of the 2009 12th International Symposium on Integrated Circuits, ISIC '09; 2009, p187-190, 4p |
| Databáze: | Complementary Index |
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